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Global and Local Entropy Tests for STL Files Under IEEE-754 Validity Constraints SPW2D8X2PG

URIm2://res/SPW2D8X2PG
Kindpreprint
CreatorsTonislav Troev, Borislav Stoyanov
Date2026-10-14
Subjectsarxiv cs.IT, arxiv cs.CR, arxiv math.IT
Scopein

Expressions

e1: version, preprint

Languageen
Date2026-10-14
IdsarXiv 2610.19852

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